Using energy-dispersive X-ray spectroscopy can provide information about the chemical composition of an object. It is instrumental in the field of chemical analysis. It is essential because it can give you the ability to distinguish between different elements in the thing. In addition, energy-dispersive X-ray spectra are very sensitive and can detect small amounts of materials.
Detection of five different types of bacterial cells
One technology in Microvision Labs detects five other bacterial cells using Energy Dispersive X-ray spectroscopy (EDX). It enables the rapid identification of viable microorganisms without dehydrating reagents. Additionally, this method offers quantitative information on the chemical makeup of infections. The technique may save time and money.
Six reference strains of food-borne diseases were used for this investigation.
. These were: Salmonella Typhimurium ATCC 43971; Cronobacter sakazakii ATCC 29004; Escherichia coli 0157: H7; Bacillus subtilis ATCC 14579; Listeria monocytogenes ATCC 19115; and Staphylococcus aureus KCCM 40050.
A combination of morphological and elemental information was used to determine the specificities of the five different bacterial cell types. A nanogold-labeled probe was used to verify the accuracy of the technique. The 1.4 nm nanogold-oligonucleotide probe was labeled with EUB338. The search was identical to the rRNA gene sequence of N. sicca.
Enhanced imaging by scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy provided microscopic and elemental information about bacterial cells. The combined information can be used to distinguish different pathogens. EDX is a fast, accurate method for detecting viable microorganisms and can be used to determine the presence of C and O.
An essential feature of energy-dispersive X-ray spectra is their ability to identify several elements simultaneously. It helps distinguish actual positive bacterial cells from false positives. For example, some bacteria may accumulate metal particles, complicating the interpretation of EDS signals.
Detection of multiple elements
Detection of multiple elements using energy-dispersive X-ray spectroscopy is a powerful method for elemental mapping labs. This method is used for quantitative and qualitative characterization of components.
The main advantage of EDXRF spectrometry is the high precision and speed of the measurement. It is susceptible to detecting a wide variety of elements in the environment. It also has the potential to identify harmful ingredients in products.
The spectra are produced by scanning an electron probe across the sample. The location of the peaks in the range determines the identification of the element. Often, spectral overlap occurs in a line or a single peak. It can lead to an inaccurate average result. However, if the peaks do not overlap, an accurate alternative analysis can be performed.
The elements with lower atomic numbers need higher sensitivity. The signal strength depends on the signal-to-noise ratio and the cleanliness of the spectrum. For example, if the spectral intensity is low, the amplitude of the X-rays will be lower. It is because X-rays scatter when they pass through objects.
Quantifying the results is based on the standard curves established by normal samples. It is done to ensure that the results are within acceptable relative deviation.
Comparison with wavelength dispersive X-ray spectroscopy
X-ray spectroscopy is one of the most potent tools for elemental analysis. It is used in many biomedical fields and also for environmental pollution studies. However, there is a difference between energy-dispersive X-ray spectroscopy (EDS) and wavelength-dispersive X-ray spectroscopy.
In both systems, a primary beam of electrons is irradiated onto a sample. Secondary electron emission is created due to the beam and sample contact. The resulting X-rays are then measured. The spectrum is a plot of counts against the energy of the X-rays. This data is then analyzed to identify elements in the sample.
During X-ray spectroscopy, the atomic structure of the emitting element is characterized. The X-rays travel line-of-sight trajectories. An electron beam produces these X-rays slowed by the electrostatic fields of atomic nuclei. The characteristic energy of each X-ray is related to the nuclear structure of the emitting element.
Both EDS and WDS systems are capable of analyzing thick sections. However, the difference between the two systems is their ability to provide high resolution. In WDS, the overlap between peaks of similar energies is smaller. In contrast, the overlapping peaks in the EDS spectrum are caused by the low spectral resolution. It is a problem that requires special tricks.
